DocumentCode :
3284376
Title :
A 12-electrode piezoelectric tube scanner for fast atomic force microscopy
Author :
Yong, Y.K. ; Ahmed, B. ; Moheimani, S.O.R.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Newcastle, NSW, Australia
fYear :
2010
fDate :
June 30 2010-July 2 2010
Firstpage :
4957
Lastpage :
4962
Abstract :
This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM). The scanner is used simultaneously as a sensor and an actuator. The built-in sensing mechanism of the scanner allows for displacement measurement and the unique arrangement of the electrodes allows the tube to be driven in an anti-symmetrical manner, resulting in a collocated system suitable for positive-position feedback (PPF). A PPF controller is designed to damp the scanner´s resonance. The device is installed into an AFM to obtain open- and closed-loop images of a grating at 10Hz, 15.6Hz and 31Hz scan rates. The closed-loop images are noticeably superior to the open-loop images, showcasing the effectiveness of the proposed scanner.
Keywords :
atomic force microscopy; closed loop systems; displacement control; displacement measurement; feedback; image sensors; open loop systems; piezoelectric actuators; resonance; 12-electrode piezoelectric tube scanner; PPF controller; actuator; atomic force microscopy; built-in sensing mechanism; closed-loop image; displacement measurement; frequency 10 Hz; frequency 15.6 Hz; frequency 31 Hz; open-loop image; positive-position feedback; resonance; sensor; Actuators; Atomic force microscopy; Atomic measurements; Displacement measurement; Electrodes; Feedback; Force sensors; Gratings; Open loop systems; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference (ACC), 2010
Conference_Location :
Baltimore, MD
ISSN :
0743-1619
Print_ISBN :
978-1-4244-7426-4
Type :
conf
DOI :
10.1109/ACC.2010.5530941
Filename :
5530941
Link To Document :
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