DocumentCode :
3284474
Title :
Implications of SiO2 Breakdown in an Integrated Nanoscale Power Supply
Author :
Budnik, Mark M. ; Roy, Kaushik
fYear :
2005
fDate :
Dec. 7-9, 2005
Firstpage :
268
Lastpage :
269
Keywords :
Breakdown voltage; Dielectric breakdown; Electric breakdown; MOSFETs; Microprocessors; Power supplies; Predictive models; Regulators; Temperature; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
Type :
conf
DOI :
10.1109/ISDRS.2005.1596088
Filename :
1596088
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3284474
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