Title :
Space-time versus frequency domain signal processing for 3D THz imaging
Author :
Heremans, Roel ; Vandewal, Marijke ; Acheroy, Marc
Author_Institution :
R. Mil. Acad., Brussels, Belgium
Abstract :
For the first time, to the best of the authors knowledge, a 3D image reconstruction is developed using wide beam THz radiation. The reconstruction method finds its origins in the domain of radar and sonar where it is known as Synthetic Aperture Radar (SAR) and Synthetic Aperture Sonar (SAS) respectively. The extension to the SAR/SAS reconstruction algorithms on wide beam terahertz radiation results in a high-resolution 3D image by combining the depth information (due to the penetration aspect of THz radiation) with a 2D scanning setup. Two 3D reconstruction algorithms have been developed, one in the space-time domain and one in the frequency domain. They both have been validated and analysed using simulated data: the azimuth resolution dependence - on the transmitted frequency and on the opening angle - is compared between the space-time and the frequency domain algorithm as well as their respective computational load. The application of the proposed imaging techniques lays in the domain of non-destructive testing (NDT) in particular for composite aircraft samples.
Keywords :
aircraft testing; frequency-domain analysis; image reconstruction; nondestructive testing; space-time adaptive processing; synthetic aperture radar; synthetic aperture sonar; terahertz wave imaging; terahertz waves; 2D scanning setup; 3D THz imaging; 3D image reconstruction algorithm; azimuth resolution; composite aircraft samples; frequency domain signal processing; nondestructive testing; space-time signal processing; synthetic aperture radar; synthetic aperture sonar; wide beam THz radiation; Algorithm design and analysis; Data analysis; Frequency domain analysis; Image reconstruction; Radar imaging; Radar signal processing; Reconstruction algorithms; Signal processing; Synthetic aperture radar; Synthetic aperture sonar;
Conference_Titel :
Sensors, 2009 IEEE
Conference_Location :
Christchurch
Print_ISBN :
978-1-4244-4548-6
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2009.5398545