• DocumentCode
    3287010
  • Title

    Least-squares parameter estimation algorithm for a microelectrothermal bridge circuit

  • Author

    Stojanovic, N. ; Berg, J.M. ; Maithripala, D.H.S. ; Holtz, M.

  • Author_Institution
    Mech. Eng. Dept. & Nano Tech Center, Texas Tech Univ., Lubbock, TX, USA
  • fYear
    2010
  • fDate
    June 30 2010-July 2 2010
  • Firstpage
    3423
  • Lastpage
    3428
  • Abstract
    A least-squares parameter estimation algorithm is designed to extract the thermal conductivity of metallic nanowires using a nanofabricated microelectrothermal test structure. The device is a thermal analog of a bridge circuit, such as is commonly used to measure electrical impedance. A resistive heater is positioned symmetrically between two temperature sensors. A nanowire array extends from the heater to one sensor, unbalancing the bridge temperatures. The least-squares cost function exploits the underlying symmetry of the thermal bridge circuit, reducing sensitivity to parasitic thermal conductances and other uncertain parameters. The algorithm is demonstrated on a series of aluminum nanowire arrays with varying nanowire widths. The results are shown to be consistent with predictions made using the electron thermal transport analogy.
  • Keywords
    bridge circuits; electron transport theory; least squares approximations; nanoelectromechanical devices; nanofabrication; nanowires; parameter estimation; thermal conductivity; electrical impedance; electron thermal transport analogy; least squares cost function; least squares parameter estimation algorithm; metallic nanowire; microelectrothermal bridge circuit; nanofabricated microelectrothermal test structure; parasitic thermal conductance; resistive heater; thermal conductivity; Algorithm design and analysis; Bridge circuits; Circuit testing; Impedance measurement; Nanostructures; Nanowires; Parameter estimation; Sensor arrays; Temperature sensors; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2010
  • Conference_Location
    Baltimore, MD
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-7426-4
  • Type

    conf

  • DOI
    10.1109/ACC.2010.5531106
  • Filename
    5531106