Title :
On-line testing of switched-capacitor filters
Author :
Huertas, José L. ; Vázquez, Diego ; Rueda, Adoración
Author_Institution :
Dept. de Diseno Analogico, Sevilla Univ., Spain
Abstract :
Proposes a new solution to alleviate the area overhead when replication is used in switched-capacitor filters. This new approach, although based on the voter mechanism, only requires a programmable biquad and some control logic as extra components (instead of the full duplication of the system). To some extent, it can be considered a first intent to apply information redundancy for the concurrent test of analog circuits.<>
Keywords :
active filters; design for testability; redundancy; switched capacitor filters; area overhead; concurrent test; control logic; information redundancy; programmable biquad; replication; switched-capacitor filters; Analog circuits; Band pass filters; Circuit testing; Communication switching; Control systems; Flexible printed circuits; Programmable control; Redundancy; Signal processing; System testing;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232732
