DocumentCode
3289061
Title
Self-testing and self-checking combinational circuits with weakly independent outputs
Author
Sogomonjan, E.S. ; Goessel, M.
Author_Institution
Inst. of Control Sci., Acad. of Sci., Moscow, Russia
fYear
1992
fDate
7-9 April 1992
Firstpage
298
Lastpage
303
Abstract
The authors propose a structure dependent method for the systematic design of self-checking error detection circuits which is well adapted to the technical fault model considered. For online detection, the hardware is in normal operation mode, and for testing in test mode. In the test mode, these error detection circuits guarantee a 100% fault coverage for single stuck-at-0/1 faults and a high fault coverage for arbitrary faults.<>
Keywords
automatic testing; combinatorial circuits; error detection; fault location; logic design; logic testing; combinational circuits; error detection circuits; fault model; high fault coverage; online detection; self-checking; structure dependent method; systematic design; weakly independent outputs; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault tolerant systems; Hardware; Monitoring;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-7803-0623-6
Type
conf
DOI
10.1109/VTEST.1992.232769
Filename
232769
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