Title :
Built-in current self-testing scheme (BICST) for CMOS logic circuits
Author :
Tong, Qiao Carol
Author_Institution :
Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
Abstract :
A novel scheme for built-in self-testing used in current testing environment (named BICST) is presented in this paper. Test vectors are generated on chip in BICST to detect the stuck-on and bridging faults as well as stuck-at faults in a CMOS circuit. The test set generated by pseudo-exhaustive testing method can detect stuck-on and bridging faults that cause abnormal large current flow in the circuit, which will be caught by the built-in current sensors. Partitioning is done for pseudo-exhaustive testing and to obtain high resolution in current measuring. The overall structure of the BICST system is also presented.<>
Keywords :
CMOS integrated circuits; built-in self test; fault location; integrated circuit testing; integrated logic circuits; logic testing; CMOS logic circuits; IDDQ testing; bridging faults; built-in current sensors; built-in self-testing; current self-testing scheme; onchip test vectors; partitioning; pseudo-exhaustive testing; quiescent power supply current; stuck-on faults; Automatic testing; Built-in self-test; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Semiconductor device modeling; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232770
