• DocumentCode
    3290099
  • Title

    Parametric Modelling Algorithms in Electrical Capacitance Tomography for Multiphase Flow Monitoring

  • Author

    Grudzien, K. ; Romanowski, A. ; Aykroyd, R.G. ; Williams, R.A. ; Mosorov, V.

  • Author_Institution
    Comput. Eng. Dept., Lodz Tech. Univ.
  • fYear
    2006
  • fDate
    24-27 May 2006
  • Firstpage
    100
  • Lastpage
    106
  • Abstract
    Bayesian statistics is a powerful physical phenomena modelling tool. However it usually demands highly iterative algorithms, hence it is was not widely used so far. Recently, rapid development of computing capabilities enables use of such methods. Computing methodology here presented features Markov chain Monte Carlo (MCMC) methods applied to Bayesian modelling. The essential aspect is enabling direct characteristic parameters estimation, hence omitting the phase of image reconstruction widely produced whenever process tomography is applied. This property has an important feature of making feasible implementation of automatic industrial process control systems based on electrical capacitance tomography (ECT)
  • Keywords
    Markov processes; Monte Carlo methods; capacitance; computational fluid dynamics; flow measurement; multiphase flow; parameter estimation; tomography; Bayesian model; Bayesian statistics; MCMC methods; Markov chain Monte Carlo methods; automatic industrial process control systems; direct characteristic parameters estimation; electrical capacitance tomography; image reconstruction; multiphase flow monitoring; parametric modelling algorithms; Bayesian methods; Condition monitoring; Electrical capacitance tomography; Electrical equipment industry; Image reconstruction; Iterative algorithms; Monte Carlo methods; Parameter estimation; Parametric statistics; Power system modeling; advanced statistical algorithms; electrical capacitance tomography; granular flow; inverse problem;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Perspective Technologies and Methods in MEMS Design, 2006. MEMSTECH 2006. Proceedings of the 2nd International Conference on
  • Conference_Location
    Lviv
  • Print_ISBN
    966-553-517-X
  • Type

    conf

  • DOI
    10.1109/MEMSTECH.2006.288675
  • Filename
    4068439