DocumentCode
3290258
Title
Valuing Reliability Indices of Composite Embedded Systems
Author
Sydor, Andriy ; Marunchak, Dariya
Author_Institution
Dept. of Automated Control Syst., Lviv Polytech. Nat. Univ.
fYear
2006
fDate
24-27 May 2006
Firstpage
157
Lastpage
158
Abstract
A method of investigation of reliability parameters of compound systems by means of generating functions is developed taking account of aging of the system´s output elements. Main reliability indices of composite embedded systems are examined in this paper
Keywords
Weibull distribution; ageing; embedded systems; reliability; Weibull distribution; composite embedded systems; compound systems; generating functions; reliability indices; reliability parameters; system output elements; Aging; Circuit simulation; Computational modeling; Embedded system; Microelectromechanical devices; Microelectronics; Optical devices; Power system modeling; Power system reliability; Weibull distribution; Weibull distribution; embedded systems; generating functions; reliability indices;
fLanguage
English
Publisher
ieee
Conference_Titel
Perspective Technologies and Methods in MEMS Design, 2006. MEMSTECH 2006. Proceedings of the 2nd International Conference on
Conference_Location
Lviv
Print_ISBN
966-553-517-X
Type
conf
DOI
10.1109/MEMSTECH.2006.288688
Filename
4068452
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