DocumentCode :
3291288
Title :
The down converter - a critical synthetic instrument technology
Author :
Mahal, Charanbir ; Granieri, Michael N.
Author_Institution :
VP Eng., Phase Matrix, Inc., San Jose, CA, USA
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
422
Lastpage :
427
Abstract :
This paper provides a brief overview of RF/microwave frequency translation functionality (up converters & down converters) and technology and discusses why they are important in the context of DOD related test and measurement. The paper then briefly reviews the concept of synthetic instruments (SI) and the role of the down converter in the SI paradigm. The paper then introduces the reader to some critical down converter specifications that must be optimized over a broad array of user RF/microwave test requirements. Based on this dissertation, the authors set forth their "One size does not fit all" thesis and introduce the concept of a "family of down converters". The authors then describe a flexible/modular down converter architecture that can be tailored to address a broad cross-section of down converter user needs. The paper then concludes with a summary statement by the authors about this critical synthetic instrument technology.
Keywords :
automatic test equipment; convertors; microwave frequency convertors; RF/microwave frequency translation functionality; RF/microwave test requirement; down converter specification; flexible/modular down converter architecture; synthetic instrument technology; up converter; Frequency measurement; Instruments; Microwave antenna arrays; Microwave frequencies; Microwave measurements; Microwave technology; Paper technology; Radio frequency; Testing; US Department of Defense;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2004. Proceedings
ISSN :
1088-7725
Print_ISBN :
0-7803-8449-0
Type :
conf
DOI :
10.1109/AUTEST.2004.1436916
Filename :
1436916
Link To Document :
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