Title :
A unified density gradient approach to ‘ab-initio’ ionised impurity scattering in 3D MC simulations of nano-CMOS variability
Author :
Alexander, C. ; Kovac, U. ; Roy, G. ; Roy, S. ; Asenov, A.
Author_Institution :
Dept E&EE, Univ. of Glasgow, Glasgow
Abstract :
A methodology for incorporating quantum corrections into self-consistent atomistic Monte Carlo (MC) simulations via the density gradient effective potential is presented. The quantum corrections not only capture charge confinement effects, but accurately represent the electron-impurity interaction used in previous dasiaab initiopsila atomistic MC simulations, showing agreement with bulk mobility simulation. The effect of quantum corrected transport variation in statistical atomistic MC simulation is then investigated using a series of realistic scaled devices. Increased current variation is observed compared with quantum corrected drift diffusion simulation and with previous classical MC results.
Keywords :
CMOS integrated circuits; Monte Carlo methods; ab initio calculations; impurity scattering; nanotechnology; ab-initio ionised impurity scattering; atomistic Monte Carlo simulation; bulk mobility simulation; charge confinement effects; density gradient effective potential; drift diffusion simulation; electron-impurity interaction; nanoCMOS variability; quantum corrections; statistical Monte Carlo simulation; three-dimensional Monte Carlo simulations; transport variation; unified density gradient; Carrier confinement; Charge carrier density; Electrostatics; Fluctuations; Impurities; MOSFETs; Monte Carlo methods; Nanoscale devices; Particle scattering; Predictive models;
Conference_Titel :
Ultimate Integration of Silicon, 2009. ULIS 2009. 10th International Conference on
Conference_Location :
Aachen
Print_ISBN :
978-1-4244-3704-7
DOI :
10.1109/ULIS.2009.4897535