A histogram based AM-BIST algorithm for ADC characterization using imprecise stimulus

Author

Parthasarathy, Kumar L. ; Jin, Le ; Kuye, Turker ; Chen, Degang ; Geiger, Randall

Author_Institution

Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA

Volume

2

fYear

2002

fDate

4-7 Aug. 2002

Abstract

A new method enabling the use of stationary non-linear signals has been proposed for testing the linearity of high resolution ADCs. With this method, linearity requirement of the source can be dramatically relaxed and faster sources can be utilized to reduce the test time and increase test coverage for the ADC. Preliminary simulation results show that with a 5-bit linear input signal, the trip points of a 11-bit Flash ADC can be identified to better than 0.5LSB and by incorporating a built-in calibration circuit, the trip point error can be decreased from an uncalibrated 15 LSB level (7-bit performance) to less than 0.5 LSB (11-bit performance) or better.

Keywords

analogue-digital conversion; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; 11 bit; AM-BIST algorithm; built-in calibration circuit; flash ADC; histogram; linearity; mixed-signal integrated circuit; stationary nonlinear signal; trip point error; Built-in self-test; Calibration; Circuit testing; Costs; Histograms; Linearity; Production; Signal generators; Signal processing; Signal processing algorithms;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on

Print_ISBN

0-7803-7523-8

Type

conf

DOI

10.1109/MWSCAS.2002.1186851

Filename

1186851