• DocumentCode
    3292945
  • Title

    Highly accurate data value prediction using hybrid predictors

  • Author

    Wang, Kai ; Franklin, Manoj

  • Author_Institution
    Datastream Syst. Inc., Greenville, SC, USA
  • fYear
    1997
  • fDate
    1-3 Dec 1997
  • Firstpage
    281
  • Lastpage
    290
  • Abstract
    Data dependences (data flow constraints) present a major hurdle to the amount of instruction-level parallelism that can be exploited from a program. Recent work has suggested that the limits imposed by data dependences can be overcome to some extent with the use of data value prediction. That is, when an instruction is fetched, its result can be predicted so that subsequent instructions that depend on the result can use this predicted value. When the correct result becomes available, all instructions that are data dependent on that prediction can be validated. This paper investigates a variety of techniques to carry out highly accurate data value predictions. The first technique investigates the potential of monitoring the strides by which the results produced by different instances of an instruction change. The second technique investigates the potential of pattern-based two-level prediction schemes. Simulation results of these two schemes show improvements over the existing method of predicting the last outcome. In particular, some benchmarks show improvement with the stride-based predictor and others show improvement with the pattern-based predictor. To do uniformly well across benchmarks, we combine these two predictors to form a hybrid predictor. Simulation analysis of the hybrid predictor shows its overall prediction accuracy to be better than that of the component predictors across all benchmarks
  • Keywords
    computer architecture; instruction sets; microprogramming; parallel programming; software performance evaluation; benchmarks; data dependences; data flow constraints; data value prediction; hybrid predictors; instruction change; instruction fetching; instruction-level parallelism; monitoring; pattern-based predictor; pattern-based two-level prediction; simulation analysis; stride-based predictor; Accuracy; Buffer storage; Computer aided instruction; Concurrent computing; Manufacturing processes; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microarchitecture, 1997. Proceedings., Thirtieth Annual IEEE/ACM International Symposium on
  • Conference_Location
    Research Triangle Park, NC
  • ISSN
    1072-4451
  • Print_ISBN
    0-8186-7977-8
  • Type

    conf

  • DOI
    10.1109/MICRO.1997.645819
  • Filename
    645819