• DocumentCode
    3293238
  • Title

    Risk Based Capacity Planning Method for Semiconductor Fab with Queue Time Constraints

  • Author

    Ono, Akira ; Kitamura, Shoichi ; Mori, Kazuyuki

  • Author_Institution
    Renesas Technol. Corp., Itami
  • fYear
    2006
  • fDate
    25-27 Sept. 2006
  • Firstpage
    49
  • Lastpage
    52
  • Abstract
    It is difficult to plan capacities of a semiconductor wafer fabrication with constraints of queue time which means a waiting time from the end of a step to the start of the next step for warranting production quality. If the queue time constraints could not be kept, the product is scrapped or reprocessed for qualitative recovery, and production efficiency remarkably decreases. This paper proposes an evaluation method which enables capacity planning of a fab with the queue time constraints, and shows its validity by simulation experiments. Furthermore we present an effectiveness of the method by applying to actual production lines.
  • Keywords
    capacity planning (manufacturing); integrated circuit manufacture; quality management; scheduling; production efficiency; production lines; production quality; queue time constraints; risk based capacity planning method; semiconductor wafer fabrication; Capacity planning; Fabrication; Investments; Manufacturing; Production facilities; Risk management; Semiconductor device manufacture; Tellurium; Time factors; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
  • Conference_Location
    Tokyo
  • ISSN
    1523-553X
  • Print_ISBN
    978-4-9904138-0-4
  • Type

    conf

  • DOI
    10.1109/ISSM.2006.4493020
  • Filename
    4493020