DocumentCode
3294131
Title
Framework for Event Driven Sorter Operation
Author
Tamehiro, Ryuji ; Herbold, Barry M. ; Gartland, Karl E. ; Liang, Frank
Author_Institution
IBM Japan Ind. Solution Co. Ltd., Kyoto
fYear
2006
fDate
25-27 Sept. 2006
Firstpage
253
Lastpage
256
Abstract
Recently most manufacturing operations in FAB are done in automated manner. Following the predefined process routing information, every lot is automatically dispatched, transported, and processed by manufacturing execution system (MES). However all kinds of wafer sorting operation cannot be predefined in the route because unplanned wafer sorting is required according to the process result, condition of process equipment, or other reason. This paper describes concerns to automate sorter operation and proposes the framework to cover both planned and unplanned sorter operation in the same automated manner with event driven base.
Keywords
electronics industry; factory automation; integrated circuit manufacture; materials handling; semiconductor technology; event driven sorter operation; manufacturing execution system; process routing information; sorter operation automation; wafer sorting operation; Automatic control; Control systems; Dispatching; Information retrieval; Manufacturing automation; Manufacturing industries; Manufacturing processes; Process control; Routing; Sorting;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
Conference_Location
Tokyo
ISSN
1523-553X
Print_ISBN
978-4-9904138-0-4
Type
conf
DOI
10.1109/ISSM.2006.4493076
Filename
4493076
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