DocumentCode
3294701
Title
Samsung Equivalence Test for Output Parameters in Semiconductor Manufacturing
Author
Ho Young Lee ; Seung Hoon Tong ; Yoon, Chung-Koo ; Hyun Cheol Lee ; Sang Wook Choi ; Kim, Hyung-Sun
Author_Institution
Samsung Electron. Co., Ltd., Hwasung
fYear
2006
fDate
25-27 Sept. 2006
Firstpage
371
Lastpage
374
Abstract
Manufacturing same product in multiple factories are very common in semiconductor manufacturing processes. When we can make the output parameters of multiple fobs reasonably identical, factories can share their resources, and this might result in improving the performance and reduce the manufacturing cost. Equivalence test of output parameters is essential to achieve this. We have reviewed several modern hypothesis techniques and applied for semiconductor manufacturing processes. After in-depth study of several techniques, architecture of Samsung Equivalence Test is established and applied.
Keywords
production testing; semiconductor device manufacture; Samsung equivalence test; semiconductor manufacturing processes; Costs; Electronic equipment testing; Gaussian distribution; Manufacturing processes; Modems; Production facilities; Semiconductor device manufacture; Semiconductor device modeling; Semiconductor device testing; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
Conference_Location
Tokyo
ISSN
1523-553X
Print_ISBN
978-4-9904138-0-4
Type
conf
DOI
10.1109/ISSM.2006.4493110
Filename
4493110
Link To Document