• DocumentCode
    3294701
  • Title

    Samsung Equivalence Test for Output Parameters in Semiconductor Manufacturing

  • Author

    Ho Young Lee ; Seung Hoon Tong ; Yoon, Chung-Koo ; Hyun Cheol Lee ; Sang Wook Choi ; Kim, Hyung-Sun

  • Author_Institution
    Samsung Electron. Co., Ltd., Hwasung
  • fYear
    2006
  • fDate
    25-27 Sept. 2006
  • Firstpage
    371
  • Lastpage
    374
  • Abstract
    Manufacturing same product in multiple factories are very common in semiconductor manufacturing processes. When we can make the output parameters of multiple fobs reasonably identical, factories can share their resources, and this might result in improving the performance and reduce the manufacturing cost. Equivalence test of output parameters is essential to achieve this. We have reviewed several modern hypothesis techniques and applied for semiconductor manufacturing processes. After in-depth study of several techniques, architecture of Samsung Equivalence Test is established and applied.
  • Keywords
    production testing; semiconductor device manufacture; Samsung equivalence test; semiconductor manufacturing processes; Costs; Electronic equipment testing; Gaussian distribution; Manufacturing processes; Modems; Production facilities; Semiconductor device manufacture; Semiconductor device modeling; Semiconductor device testing; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
  • Conference_Location
    Tokyo
  • ISSN
    1523-553X
  • Print_ISBN
    978-4-9904138-0-4
  • Type

    conf

  • DOI
    10.1109/ISSM.2006.4493110
  • Filename
    4493110