Title :
Semi-Probabilistic Content-Based Publish-Subscribe
Author :
Costa, Paolo ; Picco, Gian Pietro
Author_Institution :
Dip. di Elettronica e Informazione, Politecnico di Milano
Abstract :
Mainstream approaches to content-based distributed publish-subscribe typically route events deterministically based on information collected from subscribers, and do so by relying on a tree-shaped overlay network. While this solution achieves scalability in fixed, large-scale settings, it is less appealing in scenarios characterized by high dynamicity, e.g., mobile ad hoc networks or peer-to-peer systems. At the other extreme, researchers in the related fields of multicast and group communication have successfully exploited probabilistic techniques that provide increased fault tolerance, resilience to changes, and yet are scalable. In this paper, we propose a novel approach where event routing relies on deterministic decisions driven by a limited view on the subscription information and, when this is not sufficient, resorts to probabilistic decisions performed by selecting links at random. Simulations show that the particular mix of deterministic and probabilistic decisions we put forth in this work is very effective at providing high event delivery and low overhead in highly dynamic scenarios, without sacrificing scalability
Keywords :
ad hoc networks; decision trees; distributed processing; electronic publishing; multicast communication; routing protocols; deterministic decision; deterministic event routing; distributed publish subscribe; fault tolerance; group communication; mobile ad hoc network; multicast communication; peer-to-peer system; probabilistic decision; scalable system; semi-probabilistic content-based publish subscribe; tree-shaped overlay network; Fault tolerance; Large-scale systems; Mobile ad hoc networks; Mobile communication; Peer to peer computing; Publish-subscribe; Resilience; Routing; Scalability; Subscriptions;
Conference_Titel :
Distributed Computing Systems, 2005. ICDCS 2005. Proceedings. 25th IEEE International Conference on
Conference_Location :
Columbus, OH
Print_ISBN :
0-7695-2331-5
DOI :
10.1109/ICDCS.2005.73