DocumentCode :
3294921
Title :
Investigating useful and distinguishing features around the eyelash region
Author :
Li, Yung-hui ; Savvides, Marios ; Chen, Tsuhan
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA
fYear :
2008
fDate :
15-17 Oct. 2008
Firstpage :
1
Lastpage :
6
Abstract :
Traditionally, iris recognition is always about analyzing and extracting features from iris texture. We proposed to investigate regions around eyelashes and extract useful information which helps us to perform ethnic classification. We propose an algorithm which is easy to implement and effective. First, we locate eyelash region by using ASM to model eyelid boundary. Second, we extract local patch around local landmarks. After image processing, we are able to separate eyelashes and extract features from the directions of eyelashes. Those features are descriptive and can be used to train classifiers. Experimental results show our method can successfully perform East-Asian/Caucasian classification up to 93% accuracy, which shows our proposed method is useful and promising.
Keywords :
biometrics (access control); feature extraction; image classification; image recognition; East-Asian/Caucasian classification; ethnic classification; eyelash region; eyelid boundary; feature extraction; image processing; iris recognition; soft biometrics; Biometrics; Data mining; Eyelashes; Eyelids; Face recognition; Feature extraction; Image processing; Information analysis; Iris recognition; Linear discriminant analysis; ASM; ethnic classification; eyelash analysis; soft biometrics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Imagery Pattern Recognition Workshop, 2008. AIPR '08. 37th IEEE
Conference_Location :
Washington DC
ISSN :
1550-5219
Print_ISBN :
978-1-4244-3125-0
Electronic_ISBN :
1550-5219
Type :
conf
DOI :
10.1109/AIPR.2008.4906451
Filename :
4906451
Link To Document :
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