DocumentCode :
3297249
Title :
Noise properties of simultaneous dual tracer PET imaging
Author :
Verhaeghe, J. ; D´Asseler, Y. ; Staelens, S. ; Lemahieu, I.
Author_Institution :
ELIS-MEDISIP, Ghent Univ.
Volume :
5
fYear :
2005
fDate :
23-29 Oct. 2005
Firstpage :
2611
Lastpage :
2614
Abstract :
The Cramer-Rao lower bound (CRLB) for one dimensional dual PET imaging of equilibrated tracers was calculated. The CRLB gives us a fundamental limit on the variance one can obtain in simultaneous dual tracer PET imaging when the two tracers are separated based on their difference in tracer half-life. The CRLB depends on the acquisition time, the two tracer half-lives and the ratio of the initial activities of the two tracers. The dual tracer bounds were compared with the bounds found in the single tracer case. Convergence properties of a 2D dual tracer tomographic reconstruction were also investigated. The images were reconstructed using a parametric iterative reconstruction (PIR) algorithm and image quality was compared to the separate mono tracer ML-EM reconstructions. The PIR algorithm was found to recover the two components, however, convergence rates were slower than the mono tracer convergence rates, thus requiring more iterations to reach the same error level. The convergence rate improved drastically for increasing acquisition times. Our analysis can be extended to evaluate the limits of any number of tracer mixtures
Keywords :
image reconstruction; iterative methods; medical image processing; positron emission tomography; 2D dual tracer tomographic reconstruction; Cramer-Rao lower bound; acquisition time; iterations; monotracer ML-EM reconstruction; noise properties; parametric iterative reconstruction; simultaneous dual tracer PET imaging; tracer half-life; Convergence; Image quality; Image reconstruction; Iterative algorithms; MONOS devices; Maximum likelihood estimation; Myocardium; Positron emission tomography; Radioactive decay; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
ISSN :
1095-7863
Print_ISBN :
0-7803-9221-3
Type :
conf
DOI :
10.1109/NSSMIC.2005.1596873
Filename :
1596873
Link To Document :
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