• DocumentCode
    3298799
  • Title

    Performance of a large area Si PIN photodiode array

  • Author

    Orito, R. ; Nishimura, H. ; Hattori, K. ; Kubo, H. ; Miuchi, K. ; Nagayoshi, T. ; Okada, Y. ; Sekiya, Hiroo ; Takada, A. ; Takeda, A. ; Tanimori, T.

  • Author_Institution
    Dept. of Phys., Kobe Univ.
  • Volume
    5
  • fYear
    2005
  • fDate
    23-29 Oct. 2005
  • Firstpage
    2993
  • Lastpage
    2997
  • Abstract
    We have developed a 10 cm-square large-area Si PIN photodiode array (PDA) for a readout of a pixellated scintillator array. The 10 cm-square PDA consists of four 5 cm-square PDAs, each of which has 100 pixels with a pitch of 5 mm, and is aligned with no dead-space with each other. The structure of the PDA is based on the Hamamatsu S3590-08, which is a conventional Si PIN photodiode with an area of 1 cm-square. The cathode electrode is common, and anodes are read individually. We report the basic performance of the PDA; the quantum efficiency, leakage current, and detector capacitance. We measured X-ray spectra with radioisotopes, and evaluated the position dependence of the energy resolution. Coupling to the small CsI(Tl) scintillator bar, the gamma-ray spectrum was also measured, and the sufficient performance for a readout of CsI(Tl) scintillator was confirmed. The design and performance of the large-area PDA are reported
  • Keywords
    X-ray apparatus; gamma-ray apparatus; p-i-n photodiodes; position sensitive particle detectors; silicon radiation detectors; solid scintillation detectors; 1 cm; 10 cm; 5 cm; 5 mm; CsI(Tl) scintillator; Hamamatsu S3590-08; X-ray spectra; detector capacitance; gamma-ray spectrum; large area Si PIN photodiode array; leakage current; pixellated scintillator array; quantum efficiency; Anodes; Cathodes; Detectors; Electrodes; Energy measurement; Leak detection; Leakage current; PIN photodiodes; Position measurement; Quantum capacitance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2005 IEEE
  • Conference_Location
    Fajardo
  • ISSN
    1095-7863
  • Print_ISBN
    0-7803-9221-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2005.1596960
  • Filename
    1596960