• DocumentCode
    3298955
  • Title

    Physically-consistent parameterization in the modeling of solar photovoltaic devices

  • Author

    Yordanov, Georgi Hristov ; Midtgard, Ole-Morten

  • Author_Institution
    Dept. of Eng. Sci., Univ. of Agder, Grimstad, Norway
  • fYear
    2011
  • fDate
    19-23 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This research tests the standard one-diode model of a crystalline-Si photovoltaic cell, focusing on the physical accuracy. In particular, the (apparent) shunt resistance and the diode ideality factor are studied. Current-voltage characteristics of illuminated crystalline-Si photovoltaic modules are analyzed, and some limits of applicability of the standard model are given. Typical values of the ideality factor for crystalline-Si devices are derived from own experimental data as well as from recently published literature. It is shown that the contribution of the apparent shunt resistance is only significant for cell voltages below about 0.45 V, and depends on irradiance. This result is consistent with earlier research. Some reference books on Photovoltaics give a wrong shape of the electrical characteristic based on a non-physical interpretation of the shunt resistance. This paper may be particularly useful for power electronics engineers designing inverters and maximum-power-point tracking algorithms.
  • Keywords
    elemental semiconductors; semiconductor diodes; silicon; solar cells; Si; crystalline-silicon photovoltaic cell; current-voltage characteristics; illuminated crystalline photovoltaic modules; inverters; maximum-power-point tracking algorithms; power electronics; shunt resistance; solar photovoltaic device modelling; standard one-diode model; Educational institutions; Mathematical model; Photovoltaic cells; Photovoltaic systems; Resistance; Silicon; P-n junctions; Photovoltaic cells; Semiconductor device modeling; Shunt resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    PowerTech, 2011 IEEE Trondheim
  • Conference_Location
    Trondheim
  • Print_ISBN
    978-1-4244-8419-5
  • Electronic_ISBN
    978-1-4244-8417-1
  • Type

    conf

  • DOI
    10.1109/PTC.2011.6019232
  • Filename
    6019232