DocumentCode
3299282
Title
Thermal verification on FPGAs
Author
Boemo, Eduardo ; López-Buedo, Sergio
Author_Institution
Sch. of Eng., Univ. Autonoma de Madrid, Spain
fYear
2005
fDate
21-22 Nov. 2005
Firstpage
48
Lastpage
53
Abstract
Thermal verification of complex ICs can help the designer to detect if a particular block is working beyond specifications. A simple method is to extract the output frequencies of an array of ring-oscillators previously distributed in the die. The main advantage is that neither external transducers nor analog parts are necessary. Other possibility is to bias one of the clamping diodes usually present in the pads, and measure its junction forward voltage. In both cases, the measurement of temperature can be done in actual working conditions; that is, with the chip inside the case with its heat sink and fan.
Keywords
field programmable gate arrays; heat sinks; integrated circuit measurement; integrated circuit packaging; temperature measurement; FPGA; clamping diodes; complex integrated circuit; external transducers; heat sink; junction forward voltage; ring-oscillators; thermal verification; Clamps; Diodes; Employee welfare; Field programmable gate arrays; Frequency; Heat sinks; Semiconductor device measurement; Temperature measurement; Transducers; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
NORCHIP Conference, 2005. 23rd
Print_ISBN
1-4244-0064-3
Type
conf
DOI
10.1109/NORCHP.2005.1596986
Filename
1596986
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