Application of IEEE 1149.1 to mixed-signal measurement and test

Author

Twigg, Robert

Author_Institution

Physio-Control Corp., Redmond, WA, USA

fYear

1996

fDate

4-6 Nov 1996

Firstpage

324

Lastpage

327

Abstract

New test challenges are posed by embedded digital signal processing and analog signal conditioning circuits, particularly in wireless communication and portable high energy transfer products, where small size dictates close part proximity and few test nodes. This paper discusses the practical application of developing and implementing vector tests for highly divergent mixed signals within products. The focus of this presentation will be to highlight Boundary Scan (BScan) as a test tool to increase test coverage in ever smaller, yet more complex, printed circuit boards. An emphasis will be placed on expanding BScan test coverage by using BScan to exercise non-scan devices on the circuit board

Keywords

boundary scan testing; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; printed circuit testing; BScan; Boundary Scan; IEEE 1149.1; analog signal conditioning; embedded digital signal processing; mixed-signal measurement; nonscan device; portable high energy transfer product; printed circuit board; vector test; wireless communication; Circuit testing; Digital signal processing; Integrated circuit measurements; Nonhomogeneous media; Packaging machines; Pins; Printed circuits; Registers; Signal processing; Wireless communication;

fLanguage

English

Publisher

ieee

Conference_Titel

Northcon/96

Conference_Location

Seattle, WA

Print_ISBN

0-7803-3277-6

Type

conf

DOI

10.1109/NORTHC.1996.564955

Filename

564955