DocumentCode
330097
Title
Recent research and current issues in accelerated testing
Author
Elsayed, E.A. ; Chen, Argon C K
Author_Institution
Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
Volume
5
fYear
1998
fDate
11-14 Oct 1998
Firstpage
4704
Abstract
We review the recent research and development in modeling accelerated life testing data obtained from a wide variety of test conditions. We also discuss the developments in the degradation modeling area. General reliability models that can be used to estimate reliability at normal operating conditions are presented. The limitations and disadvantages of the current models are reviewed
Keywords
life testing; reliability theory; accelerated life testing; degradation model; reliability models; research and development; Acceleration; Degradation; Hazards; Life estimation; Life testing; Manufacturing; Performance evaluation; Predictive models; Reliability engineering; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1062-922X
Print_ISBN
0-7803-4778-1
Type
conf
DOI
10.1109/ICSMC.1998.727595
Filename
727595
Link To Document