A Study on the Design of a Testable Fleischer-Laker Switched-Capacitor Biquad

Author

Hung, Shao-Feng ; Lin, Long-Yi ; Hong, Hao-Chiao

Author_Institution

Dept. of Electr. & Comput. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

fYear

2012

fDate

14-16 May 2012

Firstpage

119

Lastpage

122

Abstract

The Fleischer-Laker Switched-Capacitor (SC) biquad is a versatile building block for implementing analog filters. This paper studies how to design a testable Fleischer-Laker SC biquad based on the static linear behavior (SLB) analog fault model. In particular, we focus on how to achieve a 100% parametric fault coverage without sacrificing the design flexibility. We suggest not to use the capacitors L, K, and J in the most generalized Fleischer-Laker biquad so as to achieve a 100% parametric fault coverage defined by the SLB analog fault model.

Keywords

biquadratic filters; failure analysis; switched capacitor filters; Fleischer-Laker SC biquad; SLB analog fault model; analog filters; design flexibility; generalized Fleischer-Laker biquad; parametric fault coverage; static linear behavior; testable Fleischer-Laker switched-capacitor biquad design; Analog circuits; Capacitors; Circuit faults; Computational modeling; Equations; Mathematical model; Transfer functions; Analog fault model; Fleischer-Laker biquad; Switched-capacitor circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2012 18th International

Conference_Location

Taipei

Print_ISBN

978-1-4673-1925-6

Type

conf

DOI

10.1109/IMS3TW.2012.33

Filename

6298729