Proceedings Seventh International On-Line Testing Workshop

fYear

2001

fDate

9-11 July 2001

Abstract

The following topics are dealt with: dependability evaluation; on-line testing for reconfigurable systems; on-line testable and fault tolerable circuits and systems; yield, test and reliability issues for very deep submicron chips; logic verification for on-line tested systems; built-in self-testing; self-checking, concurrent detection and radiation effects; automotive applications and on-line monitoring of temperature; self checking circuits and error control coding implementation; hardware and software techniques for fault tolerance; applications; and on-line testing of digital, analog and mixed signal circuits

Keywords

automatic testing; built-in self test; condition monitoring; error detection; fault tolerance; integrated circuit testing; logic testing; BIST; analog circuits; automotive applications; built-in self-testing; concurrent detection; dependability evaluation; digital circuits; error control coding implementation; fault tolerable circuits; fault tolerance; fault tolerant systems; logic verification; mixed signal circuits; online temperature monitoring; online testing; radiation effects; reconfigurable systems; reliability issues; self-checking circuits; very deep submicron chips; yield issues;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Workshop, 2001. Proceedings. Seventh International

Conference_Location

Taormina, Italy

Print_ISBN

0-7695-1290-9

Type

conf

DOI

10.1109/OLT.2001.937808

Filename

937808