DocumentCode
3301385
Title
[Title page i]
fYear
2012
fDate
14-16 May 2012
Abstract
The following topics are dealt with: mixed signal circuits; converter testing; biosensing; lab-on-a-chip testing; RF testing; PLL testing; analog design for testability; and MEMS sensor.
Keywords
analogue circuits; biosensors; design for testability; lab-on-a-chip; microsensors; mixed analogue-digital integrated circuits; phase locked loops; MEMS sensor; PLL testing; RF testing; analog design for testability; biosensing; converter testing; lab-on-a-chip testing; mixed signal circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2012 18th International
Conference_Location
Taipei
Print_ISBN
978-1-4673-1925-6
Type
conf
DOI
10.1109/IMS3TW.2012.1
Filename
6298732
Link To Document