DocumentCode :
3301731
Title :
High resolution optical lithography system using oblique incidence illumination
Author :
Matsuo, S. ; Komatsu, K. ; Takeuchi, Y. ; Tamechika, E. ; Mimura, Y. ; Harada, K.
Author_Institution :
NTT LSI Labs., Kanagawa, Japan
fYear :
1991
fDate :
8-11 Dec. 1991
Firstpage :
970
Lastpage :
972
Abstract :
The authors propose a novel optical lithography system that has a resolving power more than 1.6 times higher than the resolving power of conventional projection systems. This system offers the superior practical advantage of using conventional masks without phase shifters. The authors explain the principle of the system and present its experimental confirmation. Possible applications to advanced processes are also mentioned. The combination of the optical system with an i-line and KrF excimer laser source will most probably be the lithography method used for 64 M and 245 M DRAM (dynamic RAM) processes.<>
Keywords :
integrated circuit technology; photolithography; DRAM processes; KrF excimer laser source; conventional masks; dynamic RAM; oblique incidence illumination; optical lithography system; Apertures; Diffraction; Lenses; Lighting; Lithography; Optical filters; Resists; Spatial resolution; Telephony; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location :
Washington, DC, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-0243-5
Type :
conf
DOI :
10.1109/IEDM.1991.235262
Filename :
235262
Link To Document :
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