DocumentCode

3301752

Title

Fault Dictionary Compaction By Output Sequence Removal

Author

Boppana, Vamsi ; Fuchs, W. Kent

fYear

1994

fDate

6-10 Nov 1994

Firstpage

576

Lastpage

579

Keywords

Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Compaction; Dictionaries; Frequency; Pins; Sequential circuits; Tires;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer-Aided Design, 1994., IEEE/ACM International Conference on

ISSN

1063-6757

Print_ISBN

0-8186-3010-8

Type

conf

DOI

10.1109/ICCAD.1994.629878

Filename

629878