DocumentCode
3301771
Title
Automatic Test Program Generation For Pipelined Processors
Author
Iwashita, Hiroaki ; Kowatari, Satoshi ; Nakata, Tsuneo ; Hirose, Fumiyasu
fYear
1994
fDate
6-10 Nov 1994
Firstpage
580
Lastpage
583
Keywords
Automatic programming; Automatic testing; Circuit simulation; Computational modeling; Formal verification; Hazards; Logic design; Logic testing; Microprocessors; Pipeline processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1994., IEEE/ACM International Conference on
ISSN
1063-6757
Print_ISBN
0-8186-3010-8
Type
conf
DOI
10.1109/ICCAD.1994.629879
Filename
629879
Link To Document