DocumentCode
3301805
Title
CMOS differential and absolute thermal sensors
Author
Syal, Ashish ; Lee, Victor ; Andre, I. ; Altet, Josep
Author_Institution
Dept. of Comput. & Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
fYear
2001
fDate
2001
Firstpage
127
Lastpage
132
Abstract
This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 μm CMOS technology
Keywords
CMOS digital integrated circuits; integrated circuit testing; temperature sensors; 0.18 micron; CMOS digital IC testing; Si; differential temperature sensor; proportional to absolute temperature sensor; silicon surface; thermal mapping; CMOS digital integrated circuits; CMOS technology; Circuit faults; Circuit testing; Integrated circuit testing; Semiconductor device measurement; Sensor phenomena and characterization; Temperature measurement; Temperature sensors; Thermal sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Conference_Location
Taormina
Print_ISBN
0-7695-1290-9
Type
conf
DOI
10.1109/OLT.2001.937832
Filename
937832
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