DocumentCode :
3303470
Title :
A Fast And Memory-efficient Diagnostic Fault Simulation For Sequential Circuits
Author :
Jou, Jer Min ; Chen, Shung-Chih
fYear :
1994
fDate :
6-10 Nov 1994
Firstpage :
723
Lastpage :
726
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Flip-flops; Hafnium; Ovens; Power measurement; Sequential analysis; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
ISSN :
1063-6757
Print_ISBN :
0-8186-3010-8
Type :
conf
DOI :
10.1109/ICCAD.1994.629903
Filename :
629903
Link To Document :
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