Title :
A Fast And Memory-efficient Diagnostic Fault Simulation For Sequential Circuits
Author :
Jou, Jer Min ; Chen, Shung-Chih
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Flip-flops; Hafnium; Ovens; Power measurement; Sequential analysis; Sequential circuits;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629903