Title :
Majority and Minority Mobilities in Heavily Doped Silicon for Device Simulations
Author :
Bennett, Herbert S. ; Lowney, Jeremiah R.
Author_Institution :
National Institute of Standards and Technology
fDate :
31 May-1 Jun 1992
Keywords :
Acoustic scattering; Approximation methods; Brillouin scattering; Impurities; NIST; Optical scattering; Particle scattering; Phonons; Plasmons; Silicon;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on
Print_ISBN :
0-7803-0516-7
DOI :
10.1109/NUPAD.1992.674091
