Title :
Suboptimal partitioning of time-series data for anomaly detection
Author :
Jin, Xin ; Sarkar, Soumik ; Mukherjee, Kushal ; Ray, Asok
Author_Institution :
Dept. of Mech. Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
The concepts of symbolic dynamics and partitioning of time series data have been used for feature extraction and anomaly detection. Although much attention has been paid to modeling of finite state machines from symbol sequences, similar efforts have not been expended for partitioning of time series data to optimally generate symbol sequences. This paper addresses this issue and proposes a partitioning method based on maximum migration of data points across cell boundaries. Various aspects of the proposed partitioning tool, such as identification of evolution characteristics of dynamical systems and adaptive selection of alphabet size, are discussed. Experimental results on an electronic circuit apparatus implementing the Duffing equation show that maximum-migration partitioning yields significant improvement over existing partitioning methods (e.g., maximum entropy partitioning) for the purpose of anomaly detection.
Keywords :
feature extraction; finite state machines; optimisation; time series; Duffing equation; anomaly detection; cell boundary; data points; dynamical systems; electronic circuit apparatus; evolution characteristics; feature extraction; finite state machines; maximum migration; maximum-migration partitioning; partitioning method; partitioning tool; suboptimal partitioning; symbol sequences; symbolic dynamics; time-series data; Entropy; Feature extraction; Independent component analysis; Mechanical engineering; Nearest neighbor searches; Principal component analysis; Signal analysis; Time series analysis; USA Councils; Wavelet transforms; Anomaly detection; Maximum migration; Optimization; Partitioning; Time series analysis;
Conference_Titel :
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3871-6
Electronic_ISBN :
0191-2216
DOI :
10.1109/CDC.2009.5400158