DocumentCode :
3305829
Title :
Simulation-based development of embedded sensor fusion applications
Author :
Elmenreich, Wifried ; Schlager, Martin
Author_Institution :
Vienna Univ. of Technol.
fYear :
2004
fDate :
2004
Firstpage :
147
Lastpage :
153
Abstract :
This paper proposes a methodology for the design, testing, and fine-tuning of sensor fusion applications for distributed embedded sensor networks. The presented approach involves the following steps: (i) gathering data about the process environment, (ii) modeling of the process and the sensors to be used, (iii) selection of sensor fusion functions to process the sensor measurements, (iv) simulated closed-loop hardware-in-the-loop testing, (v) validation by open-loop testing in the real process, and, finally, (vi) application of the developed embedded sensor fusion application in the system. Particular steps may be repeated in a loop, if the result of a given step is not satisfactory. The main contribution of the approach is a separation of the modeling of process environment, sensors, and sensor processing. This allows for a strategic refinement of the model and supports the reuse and change of parts, e. g., in case of a sensor upgrade. The application of the approach is shown by a MATLAB/Simulink model that incorporates block diagrams describing process environment, sensor behavior, and sensor fusion algorithms
Keywords :
closed loop systems; distributed sensors; embedded systems; intelligent sensors; open loop systems; sensor fusion; closed-loop hardware-in-the-loop testing; data gathering; distributed embedded sensor networks; embedded sensor fusion; open-loop testing; process environment; sensor measurements; sensor processing; Data processing; Design methodology; Intelligent actuators; Intelligent sensors; Partitioning algorithms; Sensor fusion; Sensor phenomena and characterization; Sensor systems; Sensor systems and applications; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Cybernetics, 2004. ICCC 2004. Second IEEE International Conference on
Conference_Location :
Vienna
Print_ISBN :
0-7803-8588-8
Type :
conf
DOI :
10.1109/ICCCYB.2004.1437691
Filename :
1437691
Link To Document :
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