DocumentCode :
330602
Title :
Design of a neuro-classifier/detector for Amtrak rail-road track operations
Author :
Rubaai, Ahmed ; Kotaru, Raj ; Branch, Robert H. ; Hussein, Ahmed
Author_Institution :
Dept. of Electr. Eng., Howard Univ., Washington, DC, USA
Volume :
3
fYear :
1998
fDate :
12-15 Oct. 1998
Firstpage :
1703
Abstract :
This paper proposes a design for a neural network that can be used to detect and classify generic railroad operating conditions as abnormal, not reverse, normal and reverse. The proposed neural net would be of a learning vector quantization type, and would be trained online to capture the nonlinear mapping that transforms a specific location, time of the day, and direction of travel into a quantitative statement of whether or not an abnormal operating condition is possible at these inputs. Chosen as the test bed for this work is the Centralized Electrification and Traffic Control (CETC) system operated by Amtrak on the northeast corridor. Specifically, it is planned to develop and install a neural net based system and allow it to detect "normal" traffic patterns, switch settings and security conditions. To the best of the authors\´ knowledge no similar work is outstanding, planned or anticipated at this time.
Keywords :
learning (artificial intelligence); neural nets; rail traffic; railways; traffic control; traffic engineering computing; Amtrak rail-road track operations; Centralized Electrification and Traffic Control system; abnormal operating condition; learning vector quantization; neural net based system; neuro-classifier; neuro-detector; nonlinear mapping; normal traffic patterns detection; northeast corridor; online neural net training; security conditions; switch settings; travel direction; Communication system traffic control; Detectors; Neural networks; Quantization; Roads; Switches; System testing; Traffic control; Training data; Transportation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-4943-1
Type :
conf
DOI :
10.1109/IAS.1998.729801
Filename :
729801
Link To Document :
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