Title :
Simulated Performance Evaluation of a 6D Mesh/iBT Interconnect
Author :
Feng, Rui ; Zhang, Peng ; Deng, Yuefan
Author_Institution :
Sch. of Comput. Sci. & Eng., Beihang Univ., Beijing, China
Abstract :
A new 6D mesh/torus (Tofu) interconnect is implemented in the K Computer for achieving a performance of more than 10 petaflops. As expected, among its many interesting properties, such interconnect has large variations of latencies for communications within a node-group (intra-node-group) or between them (inter-node-group). Inspired by their works while recognizing the superior features of the recently published interlaced bypass torus (iBT) network that can help reduce such variations, we propose a new 6D mesh/iBT interconnect by replacing the 3D torus of Tofu by a 3D iBT. Our new interconnect suppresses the latencies for inter-node-group communications to dramatically improve the overall performance for the entire network. Adapting an industrial standard network simulator NS-3, we study different communication patterns of the added iBT networks under different bypass schemes. We find that the simulated average latencies of our network are 40% less than those of the Tofu interconnect for all tested patterns.
Keywords :
multiprocessor interconnection networks; performance evaluation; 3D iBT; 3D torus; 6D mesh/iBT interconnect; 6D mesh/torus interconnect; K computer; NS-3; Tofu interconnect; bypass schemes; communication patterns; iBT network; industrial standard network simulator; inter-node-group communications; interlaced bypass torus network; intra-node-group; overall performance; petaflops; simulated average latency; simulated performance evaluation; Computers; Educational institutions; Green products; Network topology; Receivers; Routing; Topology; interconnection network; performance evaluation; simulation;
Conference_Titel :
Software Engineering, Artificial Intelligence, Networking and Parallel & Distributed Computing (SNPD), 2012 13th ACIS International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-2120-4
DOI :
10.1109/SNPD.2012.19