Measurement Of Secondary Electron Emission Coefficient From MgO Protecting Layer

Author

Choi, E.H. ; Oh, H.J. ; Kim, Y.G. ; Ko, J.J. ; Cho, T.S. ; Kim, D.I. ; Cho, G.S. ; Kang, S.O.

Author_Institution

Kwangwoon University

fYear

1998

fDate

13-16 July 1998

Firstpage

288

Lastpage

290

Keywords

Acceleration; Anodes; Crystallization; Electron emission; Ion beams; Plasma displays; Plasma measurements; Probes; Protection; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Microprocesses and Nanotechnology Conference, 1998 International

Conference_Location

Kyoungju, South Korea

Print_ISBN

4-930813-83-2

Type

DOI

10.1109/IMNC.1998.730086

Filename

730086

Link To Document