• DocumentCode
    330756
  • Title

    Defect vs. Nanocrystal Luminescence Emitted In Si - implanted SiO2 Layer

  • Author

    Jeong, J.Y. ; Im, S. ; Oh, M.S. ; Kim, H.B. ; Chae, K.H. ; Whang, C.N. ; Song, J.H.

  • Author_Institution
    Yonsei University
  • fYear
    1998
  • fDate
    13-16 July 1998
  • Firstpage
    305
  • Lastpage
    306
  • Keywords
    Annealing; Control systems; Crystallization; Integrated circuit technology; Luminescence; Nanocrystals; Photoluminescence; Potential well; Size control; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 1998 International
  • Conference_Location
    Kyoungju, South Korea
  • Print_ISBN
    4-930813-83-2
  • Type

    conf

  • DOI
    10.1109/IMNC.1998.730094
  • Filename
    730094
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=330756