DocumentCode
330841
Title
Investigation of the correlation of peel strength and pad adhesion measurements using different printed circuit board base materials
Author
Mueller, Steffen
Author_Institution
Hewlett-Packard GmbH, Boblingen, Germany
fYear
1998
fDate
19-21 Oct 1998
Firstpage
58
Lastpage
65
Abstract
The adhesion of pads to the PCB base material has, along with the assembly method, an essential impact on the reparability of components without damaging the PCB. Various test methods have been developed to evaluate Cu adhesion to different base materials. Two of those methods, the pad adhesion test and the peel strength test, have been investigated with the objective of finding the degree of correlation between the results obtained. A correlation of both methods would allow the use of the simpler measurement to obtain data about the more interesting parameter. In the test plan, the main factors influencing peel strength and pad adhesion are discussed, and the test matrix for both the initial and the main test is shown. The pad adhesion and peel strength measurement methods are explained, along with design of the test boards. The influence of the period between sample preparation (conventional print and etch process) and measurement, stripe width and stripe orientation at the base material on the peel strength values and the effect of pad shape, number, size and pattern on the pad adhesion data is shown and discussed. After fixing the test parameters, the main measurements were made using a conventional FR4 material. A correlation of pad adhesion and peel strength values has not been found due to the different fracture interfaces resulting from the different kinds of stress. A second test using Speedboard NTM material showed a correlation of peel strength and pad adhesion data, based on the same fracture mode despite different kinds of stress
Keywords
adhesion; copper; fracture; materials testing; mechanical testing; metallisation; printed circuit design; printed circuit testing; Cu; Cu adhesion; FR4 material; PCB base materials; PCB test methods; Speedboard N material; assembly method; base materials; component reparability; fracture interfaces; fracture mode; measurement correlation; pad adhesion; pad adhesion measurement; pad adhesion test; pad number; pad pattern; pad shape; pad size; peel strength; peel strength measurements; peel strength test; print/etch process; printed circuit board base materials; sample preparation; stress; stripe orientation; stripe width; test board design; test matrix; test parameters; Adhesives; Assembly; Atherosclerosis; Circuit testing; Copper; Electronic equipment testing; Etching; Materials testing; Shape measurement; Size measurement; Software measurement; Software testing; Stress; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
Conference_Location
Austin, TX
ISSN
1089-8190
Print_ISBN
0-7803-4523-1
Type
conf
DOI
10.1109/IEMT.1998.731025
Filename
731025
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