Title :
On the fault-injection-caused increase of the DAE-index in analogue fault simulation
Author :
Straube, Bernd ; Reinschke, Kurt ; Vermeiren, Wolfgang ; Röbenack, Klaus ; Müller, Bert ; Clauß, Christoph
Author_Institution :
Fraunhofer-Inst. fur Integrierte Schaltungen, Erlangen, Germany
Abstract :
This paper demonstrates the possibility of the occurrence of numerical problems in analogue fault simulation due to a fault-injection-caused increase of the DAE-index. Based on analytical results and fault simulation experiments with two electrical networks it is shown that a network showing no numerical problems during its fault-free simulations may increase its index as a result of the injection of a fault. The higher index causes numerical problems during the simulation. Some suggestions to tackle such index problems are discussed.
Keywords :
analogue circuits; analogue simulation; differential equations; fault simulation; numerical analysis; DAE-index; analogue fault simulation; differential equations; electrical networks; fault-free simulation; fault-injection; injection of fault; linear network; numerical problems; Capacitors; Circuit faults; Circuit simulation; Differential equations; Fault detection; Inductors; Intelligent networks; Resistors; Testing; Voltage;
Conference_Titel :
European Test Workshop 1999. Proceedings
Conference_Location :
Constance, Germany
Print_ISBN :
0-7695-0390-X
DOI :
10.1109/ETW.1999.804423
