Title :
On maximizing the coverage of catastrophic and parametric faults
Author :
Brosa, Anna M. ; Figueras, Joan
Author_Institution :
Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
Abstract :
The purpose of this paper is to analyze an optimization method to improve the testability of structural and parametric faults in analog circuits. The approach consists of finding an optimum sub-set of tests which maximizes the fault coverage with minimum cost. The method is based on covering a discrete set of intervals by taking advantage of strategies effectively used in digital synthesis. A simple application example is given to illustrate the proposal by studying the fault coverage obtained using different test sets on the ITC´97 benchmark op-amp.
Keywords :
analogue circuits; design for testability; fault simulation; integrated circuit economics; operational amplifiers; optimisation; CMOS; ITC´97 benchmark op-amp; analog circuits; catastrophic faults; digital synthesis; fault coverage; floating gate; minimum cost; optimization; optimum sub-set of tests; parametric faults; resistive bridges; structural faults; testability; Analog circuits; Benchmark testing; Circuit faults; Circuit synthesis; Circuit testing; Cost function; Fault detection; Operational amplifiers; Optimization methods; Proposals;
Conference_Titel :
European Test Workshop 1999. Proceedings
Conference_Location :
Constance, Germany
Print_ISBN :
0-7695-0390-X
DOI :
10.1109/ETW.1999.804430
