DocumentCode
3312469
Title
The feature extraction of brain evoked potential based on wavelet transformation
Author
Yu, Lanlan
Author_Institution
Sch. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo, China
fYear
2009
fDate
8-11 Aug. 2009
Firstpage
172
Lastpage
175
Abstract
The brain evoked potentials (BEP) are related directly to series of diseases and physical states. It is helpful to prevent and diagnose the brain diseases by analyzing evoked potentials. The traditional averaged method can show the shape of evoked potentials in the rough but losses some important components. At the same time, the plus number is so many that it will increase the pain of the testee. Wavelet transformation is a rising technology in signal processing which has the feature of multi-resolution analysis. In this paper, we use wavelet transformation for the feature extraction of brain evoked potential and compare with the traditional averaged method. We can see that the evoked potential can be identified only with few plus signals by wavelet transformation technology and the wave of the signal is very smooth which not only saves the useful signal well but also rejects almost all the background noises. Experiments show that the wavelet transformation has good efficiency in the feature extraction of the BEP which has upper application value in the clinic.
Keywords
bioelectric potentials; brain; diseases; feature extraction; medical signal processing; neurophysiology; patient diagnosis; signal resolution; wavelet transforms; background noises; brain disease diagnosis; brain evoked potential; feature extraction; multiresolution analysis; physical states; signal processing; wavelet transformation technology; Background noise; Brain; Diseases; Feature extraction; Frequency domain analysis; Pain; Signal analysis; Signal processing; Testing; Wavelet analysis; evoked potential; feature extraction; wavelet transformation;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4519-6
Electronic_ISBN
978-1-4244-4520-2
Type
conf
DOI
10.1109/ICCSIT.2009.5234596
Filename
5234596
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