DocumentCode :
3313085
Title :
Error analysis of spectral reflectance derived from imaging spectrometer data
Author :
Kerekes, John P.
Author_Institution :
Lincoln Lab., MIT, Cambridge, MA, USA
Volume :
5
fYear :
1998
fDate :
6-10 Jul 1998
Firstpage :
2697
Abstract :
As the field of remote imaging spectrometry grows, interest increases in applications that require the data be “corrected” to surface reflectance. However, the utility of the data for these applications will be limited by the accuracy to which the correction can be performed. Two approaches to atmospheric compensation are reviewed and applied to airborne spectrometer data to study their error characteristics. An end-to-end analysis model is used to extend the study to examine the effects of individual sources of error. Results indicate that random errors of 1 to 2% reflectance units and bias errors of 1 to 4% are achievable in atmospheric window regions, with considerably higher errors in atmospheric absorption bands
Keywords :
atmospheric optics; geophysical techniques; remote sensing; terrain mapping; atmospheric compensation; atmospheric correction; end-to-end analysis model; error; error analysis; geophysical measurement technique; hyperspectral imaging; land surface; multispectral remote sensing; optical imaging; optics; spectral reflectance; surface reflectance; terrain mapping; Absorption; Atmospheric modeling; Error analysis; Error correction; Layout; Lighting; Reflectivity; Scattering; Sensor phenomena and characterization; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium Proceedings, 1998. IGARSS '98. 1998 IEEE International
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4403-0
Type :
conf
DOI :
10.1109/IGARSS.1998.702323
Filename :
702323
Link To Document :
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