• DocumentCode
    3313183
  • Title

    Roundoff error-free tests in algorithm-based fault tolerant matrix operations on 2-D processor arrays

  • Author

    Wei, Dah-Yea D. ; Kim, Jung H. ; Rao, T.R.N.

  • Author_Institution
    Center for Adv. Comput. Studies, Southwestern Louisiana Univ., Lafayette, LA, USA
  • fYear
    1994
  • fDate
    17-19 Oct 1994
  • Firstpage
    74
  • Lastpage
    82
  • Abstract
    Assaad and Dutt [1992] proposed the hybrid checksum test method for the floating-point matrix-matrix multiplication in ABFT environment, by which the error coverage can be greatly increased. However, the threshold test in their approach is still necessary in the floating-point addition part of the matrix multiplication, and the number of error detections decreases with the increase in the dynamic range of data. Here, instead of using the threshold floating-point checksum test, we present an effective method, called the concurrent floating-point checksum (CFPC) test. The proposed CFPC test provides complete error detection/correction capabilities in floating-point additions with less time latency and hardware overhead regardless of the dynamic range of input data
  • Keywords
    fault tolerant computing; 2D processor arrays; algorithm-based fault tolerant matrix operations; concurrent floating-point checksum test; dynamic range; error correction; error detection; floating-point additions; hardware overhead; roundoff error-free tests; time latency; Computer errors; Delay; Dynamic range; Error correction; Fault detection; Fault tolerance; Hardware; Information science; Performance evaluation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1994. Proceedings., The IEEE International Workshop on
  • Conference_Location
    Montreal, Que.
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-6307-3
  • Type

    conf

  • DOI
    10.1109/DFTVS.1994.630016
  • Filename
    630016