Title :
Discrimination of scattering mechanisms via polarimetric rcs imaging [measurements corner]
Author :
Dallmann, Thomas ; Heberling, Dirk
Author_Institution :
Institute of High Frequency Technology (IHF), RWTH Aachen Melatener Strasse 25, 52074 Aachen, Germany
Abstract :
Radar cross section (RCS) images describe position and scattering brightness of scattering centers of a radar target, but lack information about the underlying scattering mechanisms. This information can be valuable help for the design of radar targets, as soon as it becomes available. The proposed method uses a polarimetric approach to detect and discriminate three different scattering mechanisms, independently of the orientation of the scatterers. These mechanisms can be separately visualized for easy interpretation of the physical processes occurring at the radar target. Measurement results recorded in a compact range demonstrated the practical applicability of this approach.
Keywords :
Electromagnetic scattering; Polarimetric imaging; Radar imaging; Radar measurements; Radar polarimetry; Scattering; Scattering parameters; Synthetic aperture radar; Visualization; Radar measurements; inverse synthetic aperture radar; polarimetric synthetic aperture radar; radar cross section; radar imaging; radar polarimetry; scattering parameters; visualization;
Journal_Title :
Antennas and Propagation Magazine, IEEE
DOI :
10.1109/MAP.2014.6867696