DocumentCode :
3314424
Title :
Automated processing of electron diffraction data
Author :
Burenko, Oleg ; Ludtka, Gail M.
Author_Institution :
Oak Ridge Nat. Lab., TN, USA
fYear :
1989
fDate :
9-12 Apr 1989
Firstpage :
342
Abstract :
An Electron Diffraction Identification Program has been developed to process VAX 11/780 electron diffraction data files. The Program is automated to select sets of three and then five diffraction spots, satisfying operator-selected linearity and spacing conditions. A crystallographic reference file allows an automatic specimen identification, which is CRT-displayed to an operator, while all pertinent information is recorded into an output file. It is noted that the program effectively does away with the extremely time-consuming tasks which normally must be performed using conventional analysis methods. The program allows identification of specimens without the highly specialized knowledge of the electron diffraction pattern analysis. In addition, the program shortens considerably the specimen identification time expended
Keywords :
cathode-ray tube displays; computerised instrumentation; electron diffraction crystallography; physics computing; Electron Diffraction Identification Program; VAX 11/780; automatic specimen identification; crystallographic reference file; diffraction spots; electron diffraction data; identification time; operator-selected linearity; Crystalline materials; Crystallization; Crystallography; Diffraction; Electron beams; Electron microscopy; Measurement units; Pattern analysis; Solid state circuits; Telecommunication computing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
Type :
conf
DOI :
10.1109/SECON.1989.132391
Filename :
132391
Link To Document :
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