Title :
Reliability and Life Prediction for electronic connectors for control applications
Author :
Varde, P.V. ; Agarwal, M. ; Marathe, P.P. ; Mohapatra, U. ; Sharma, R.C. ; Naikan, V.N.A.
Author_Institution :
Bhabha Atomic Res. Centre, Mumbai, India
Abstract :
This paper presents the application of Life testing methods for Life and Reliability Prediction of new components. The procedure developed for this work can be adopted for testing of any components by incorporating component specific changes. There are two major feature of this work. First, the emphasis of this work was to take life testing methods to understand the physics-of-failure of the components by extending the life testing methods to further statistical analysis and micro-structural examination. Second, to make the testing process more effective and efficient, the test specifications have been worked out using Design of Experiment method.
Keywords :
design of experiments; electronic equipment testing; life testing; components testing; control applications; design of experiment method; electronic connectors; life prediction; life testing methods; microstructural examination; reliability; statistical analysis; Corrosion; Humidity; Instruments; Stress; Temperature measurement; Testing; Uncertainty; Electronic connectors; Life & Reliability Prediction; Life Testing and Physics-of-Failure Methods;
Conference_Titel :
Reliability, Safety and Hazard (ICRESH), 2010 2nd International Conference on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4244-8344-0
DOI :
10.1109/ICRESH.2010.5779634