• DocumentCode
    3315459
  • Title

    A new algorithm to Test Suite Reduction based on cluster analysis

  • Author

    Parsa, S. ; Khalilian, A. ; Fazlalizadeh, Y.

  • Author_Institution
    Comput. Eng. Dept., Iran Univ. of Sci. & Technol., Tehran, Iran
  • fYear
    2009
  • fDate
    8-11 Aug. 2009
  • Firstpage
    189
  • Lastpage
    193
  • Abstract
    Regression testing is a significant activity which occurs during the maintenance level of a software lifecycle. However, it requires a large amount of test cases to test new or modified parts of the software. To address the issue, test suite reduction techniques have been presented. An appropriate technique should generate a minimized test suite which exercises different execution paths within a program while retaining the fault detection capability of the suite admissible. To achieve this, a heuristic algorithm is proposed in this paper. The new algorithm clusters test cases based on the similarity of their execution profiles and sample some representatives to form the reduced test suite. The results of applying the new algorithm to the Siemens suite and comparing to the H algorithm manifest interesting insights into the effectiveness of the proposed algorithm.
  • Keywords
    regression analysis; software maintenance; H algorithm; Siemens suite; cluster analysis; execution profile; fault detection capability; regression testing; software lifecycle maintenance; test suite reduction technique; Algorithm design and analysis; Automatic testing; Clustering algorithms; Costs; Fault detection; Filtering; Heuristic algorithms; Sampling methods; Software maintenance; Software testing; fault detection; software regression testing; test suite minimization; test suite reduction; testing criteria;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4519-6
  • Electronic_ISBN
    978-1-4244-4520-2
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2009.5234742
  • Filename
    5234742