Title :
Structural and phase investigations in oxides of the Al/sub 2/O/sub 3/-ZrO/sub 2/ system following the action of low-temperature plasma
Author :
Beznosov, P.A. ; Kondratyuk, A.A. ; Romanov, B.P.
Author_Institution :
Tomsk State Archit. & Building Univ., Russia
Abstract :
Non-steady physical and chemical processes in oxide materials are very important when reaching extreme pressures, temperatures, and speeds of these materials treatment by means of different untraditional technologies. This paper investigates the processes of viscous flow, vaporization and change: of the structure of refractory oxides under the action of electric arc plasma within the temperatures of 1500-4500 K. Phase composition and thin structure of the lattices were studied by the methods of radiography (DRON-3M) as well as by the methods of microscopy and infrared microscopy. Investigating the structure of the eutectic following the plasma smelt in the nitrogen medium by the method of infrared spectroscopy the occurrence of the bands of absorption of hexagonal AIN (714 cm-1, 1057 cm-1, 1183 cm-1) as well as the shift of main bands of absorption for the bonds ZrO-O-Zr (610 cm-1, 735 cm-1) oscillation were determined.
Keywords :
aluminium compounds; arcs (electric); infrared spectroscopy; low-temperature techniques; plasma; radiography; vaporisation; zirconium compounds; Al2O3-ZrO2; chemical processes; electric arc plasma; infrared microscopy; infrared spectroscopy; low-temperature plasma; nonsteady physical processes; oxide materials; phase composition; radiography; thin structure; vaporization; viscous flow; Chemical processes; Chemical technology; Electromagnetic wave absorption; Lattices; Microscopy; Phase change materials; Plasma chemistry; Plasma materials processing; Plasma temperature; Radiography;
Conference_Titel :
Modern Techniques and Technologies, 2003. MTT 2003. Proceedings of the 9th International Scientific and Practical Conference of Students, Post-graduates and Young Scientists
Conference_Location :
Tomsk
Print_ISBN :
0-7803-7669-2
DOI :
10.1109/SPCMTT.2003.1438184